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首页> 外文期刊>International Journal of Electrochemical Science >Mechanical features of copper coatings electrodeposited by the pulsating current (PC) regime on Si(111) substrate
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Mechanical features of copper coatings electrodeposited by the pulsating current (PC) regime on Si(111) substrate

机译:通过脉动电流(PC)衬底上的脉动电流(PC)制度电沉积的铜涂层的机械特征

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Mechanical features of the Cu coatings produced by the pulsating current (PC) regime on Si(111)substrate have been investigated. The Cu coatings were electrodeposited by varying duty cycle (15?50%) and keeping the current density amplitude constant (100 mA cm?2), and by keeping duty cycleconstant (50 %) but varying the current density amplitude value (80?120 mA cm?2). The scanningelectron microscopy (SEM) and optical microscopy (OM) techniques showed that morphology of thecoatings changed with increasing the duty cycle from those with large and well defined grains touniform and compact fine-grained coatings. The Vickers microindentation technique was used for anexamination of hardness applying the Chen-Gao (C-G) composite hardness model and indentationcreep features of the Cu coatings. The obtained values of hardness for the Cu coatings on Si(111) inthe 0.9069?1.5079 GPa range indicated the successful implementation of the C-G model for this ?softfilm on hard substrate“ composite system. The obtained stress exponents ranging from 2.79 to 5.29indicated that creep mechanism changed from grain boundary sliding to both dislocation climbs anddislocation creep with decreasing duty cycle values. The maximum hardness and minimum stressexponent was obtained for the fine-grained Cu coating produced with a duty cycle of 50 % and thecurrent density amplitude of 100 mA cm-2, indicating that its plastic deformation duringmicroindentation was primarily caused by grain boundary sliding. Optimization of process formationand mechanical features of the Cu coatings was made using Response Surface Methodology (RSM),and error of 3.2 % showed a good agreement between predicted and measured values..
机译:研究了通过脉动电流(PC)制造的Cu涂层的机械特征已经研究了Si(111)衬底上的脉动电流(PC)。通过不同的占空比(15≤50%)电沉积Cu涂层,并保持电流密度幅度常数(100 mA cm 2),并通过保持占空比(50%)但改变电流密度幅度值(80?120马厘米?2)。扫描电子显微镜(SEM)和光学显微镜(OM)技术表明,随着占颗粒颗粒型和紧凑型细粒涂层的颗粒的占空比,将占占空比的形态变化。 Vickers微图形技术用于应用Chen-Gao(C-G)复合硬度模型和Cu涂层的凹进特征的硬度的抑制作用。 Si(111)上的Cu涂层的硬度值为0.9069?1.5079 GPA范围表示在硬质基板上的C-G模型的成功实现,在硬质基板上“复合系统”。所获得的应力指数从2.79到5.29Indicticated,从晶界滑动到两个位错升降的蠕变机制与降低占空比值的蠕变和分区蠕变。获得的最大硬度和最小应力为400mA cm-2的占空比产生的细粒淀粉涂层,表明其在澄清期间其塑性变形主要由晶界滑动引起的。使用响应表面方法(RSM)制造工艺形成和Cu涂层的机械特征的优化,3.2%的误差显示了预测和测量值之间的良好一致性..

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