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Iron loss evaluation of magnetic materials excited by a SiC inverter with a Schottky barrier diode wall-integrated trench MOSFET

机译:SiC逆变器用肖特基势垒二极管壁 - 集成沟MOSFET激发的磁性材料的铁损评估

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This study examines the impact of the different diode characteristics on the magnetic hysteretic and iron loss properties of a conventional non-oriented (NO) silicon steel sheet core under silicon carbide (SiC) inverter excitation. We compared the magnetic properties of the magnetic core excited by the inverter using the developed Schottky barrier diode (SBD) wall-integrated trench MOSFET (SWITCH–MOS), which has a low on-voltage V subon/sub diode, with those excited by the inverter using a conventional U-shaped trench gate MOSFET (UMOS), which has a body PiN diode with high V subon/sub. This study shows for the first time that the shape of the minor loop and iron loss properties depends strongly on only the diode characteristics in the inverter. The iron loss of magnetic materials excited by the SWITCH–MOS inverter with the low- V subon/sub diode (i.e., the built-in SBD) was less than that in the case of using the conventional UMOS with a high- V subon/sub diode (i.e., the body PiN diode). That is, the SWITCH–MOS with built-in SBD can reduce not only the switching loss, but also the iron loss in magnetic materials such as motor cores.
机译:本研究研究了不同二极管特性对碳化硅(SiC)逆变器激发的常规非取向(NO)硅钢板芯的磁滞圈和铁损性的影响。我们将逆变器激发的磁芯的磁性与使用开发的肖特基势垒二极管(SBD)壁集沟槽MOSFET(Switch-MOS)进行了磁性芯的磁性,其在二极管上具有低电压V ,使用传统的U形沟槽栅极MOSFET(UMOS)被逆变器激发的那些,其在上具有高V 的体引脚二极管。本研究首次示出了次要环路和铁损性的形状仅在逆变器中的二极管特性上强烈取决于逆变器。开关MOS逆变器激发的磁性材料的铁损失在二极管上的低温(即,内置SBD)的情况下小于使用传统UMOS的情况下二极管(即,主体引脚二极管)高V 。也就是说,带内置SBD的开关MOS不仅可以减少开关损耗,也可以减少磁性材料等铁损失。

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