首页> 外文期刊>Condensed Matter >The Effect of Point Defects on the Electronic Density of States of ScMN2-Type (M = V, Nb, Ta) Phases
【24h】

The Effect of Point Defects on the Electronic Density of States of ScMN2-Type (M = V, Nb, Ta) Phases

机译:点缺陷对SCMN2型(M = V,NB,TA)相位的电子密度的影响

获取原文
           

摘要

ScMN2-type (M = V, Nb, Ta) phases are layered materials that have been experimentally reported for M = Ta and Nb. They are narrow-bandgap semiconductors with potentially interesting thermoelectric properties. Point defects such as dopants and vacancies largely affect these properties, motivating the need to investigate these effects. In particular, asymmetric peak features in the density of states (DOS) close to the highest occupied state is expected to increase the Seebeck coefficient. Here, we used first principles calculations to study the effects of one vacancy or one C, O, or F dopant on the DOS of the ScMN2 phases. We used density functional theory to calculate formation energy and the density of states when a point defect is introduced in the structures. In the DOS, asymmetric peak features close to the highest occupied state were found as a result of having a vacancy in all three phases. Furthermore, one C dopant in ScTaN2, ScNbN2, and ScVN2 implies a shift of the highest occupied state into the valence band, while one O or F dopant causes a shift of the highest occupied state into the conduction band.
机译:SCMN2型(M = V,NB,TA)相是已经通过实验报告的分层材料,用于M = TA和NB。它们是具有潜在有趣的热电性能的窄带隙半导体。点缺陷如掺杂剂和空位在很大程度上影响了这些性质,激励了研究这些效果的需要。特别地,预计靠近占用状态的状态密度(DOS)的不对称峰值特征将增加塞贝克系数。在这里,我们使用了第一种原理计算来研究一种空位或一个C,O或F掺杂剂对SCMN2阶段的DOS的影响。当在结构中引入点缺陷时,我们使用密度泛函理论来计算形成能量和状态的密度。在DOS中,由于在所有三个阶段具有空位,发现了靠近最高占用状态的不对称峰值特征。此外,SCTAN2,SCNBN2和SCVN2中的一个C掺杂剂意味着将最高占用状态的偏移到价带中,而一个O或F掺杂剂导致最高占用状态的偏移到导通带中。

著录项

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号