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Enhancing Short-Term Plasticity by Inserting a Thin TiO2 Layer in WOx-Based Resistive Switching Memory

机译:通过在基于WOX的电阻开关存储器中插入薄TiO2层来提高短期可塑性

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In this work, we emulate biological synaptic properties such as long-term plasticity (LTP) and short-term plasticity (STP) in an artificial synaptic device with a TiN/TiO2/WOx/Pt structure. The graded WOx layer with oxygen vacancies is confirmed via X-ray photoelectron spectroscopy (XPS) analysis. The control TiN/WOx/Pt device shows filamentary switching with abrupt set and gradual reset processes in DC sweep mode. The TiN/WOx/Pt device is vulnerable to set stuck because of negative set behavior, as verified by both DC sweep and pulse modes. The TiN/WOx/Pt device has good retention and can mimic long-term memory (LTM), including potentiation and depression, given repeated pulses. On the other hand, TiN/TiO2/WOx/Pt devices show non-filamentary type switching that is suitable for fine conductance modulation. Potentiation and depression are demonstrated in the TiN/TiO2 (2 nm)/WOx/Pt device with moderate conductance decay by application of identical repeated pulses. Short-term memory (STM) is demonstrated by varying the interval time of pulse inputs for the TiN/TiO2 (6 nm)/WOx/Pt device with a quick decay in conductance.
机译:在这项工作中,我们用锡/ TiO2 / WOX / PT结构模拟人造突触装置中的长期塑性(LTP)和短期塑性(STP)的生物突触特性。通过X射线光电子能谱(XPS)分析确认具有氧空位的渐变WOX层。控制TIN / WOX / PT器件在DC扫描模式下显示丝状切换,具有突出的集合和逐渐复位过程。由于双DC扫描和脉冲模式验证,TIN / WOX / PT设备易于设置粘连。锡/莫/ PT装置具有良好的保留,并且可以对具有重复脉冲的抑制和抑郁术来模仿长期记忆(LTM)。另一方面,TIN / TIO2 / WOX / PT器件显示出非丝状型切换,适用于微量电导调制。通过施加相同的重复脉冲,在锡/ TiO 2(2nM)/ WOX / PT装置中,在锡/ TiO 2(2nM)/ WOX / PT装置中展示了增强和抑郁症。通过改变锡​​/ TiO2(6nm)/ Wox / Pt装置的脉冲输入的间隔时间来证明短期存储器(STM),并在电导中快速衰减。

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