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Towards integrated metatronics: a holistic approach on precise optical and electrical properties of Indium Tin Oxide

机译:朝向集成的METATRONICS:全面探讨氧化铟锡的精确光学和电学性能

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The class of transparent conductive oxides includes the material indium tin oxide (ITO) and has become a widely used material of modern every-day life such as in touch screens of smart phones and watches, but also used as an optically transparent low electrically-resistive contract in the photovoltaics industry. More recently ITO has shown epsilon-near-zero (ENZ) behavior in the telecommunication frequency band enabling both strong index modulation and other optically-exotic applications such as metatronics. However, the ability to precisely obtain targeted electrical and optical material properties in ITO is still challenging due to complex intrinsic effects in ITO and as such no integrated metatronic platform has been demonstrated to-date. Here we deliver an extensive and accurate description process parameter of RF-sputtering, showing a holistic control of the quality of ITO thin films in the visible and particularly near-infrared spectral region. We are able to custom-engineer the ENZ point across the telecommunication band by explicitly controlling the sputtering process conditions. Exploiting this control, we design a functional sub-wavelength-scale filter based on lumped circuit-elements, towards the realization of integrated metatronic devices and circuits.
机译:透明导电氧化物的类包括材料铟锡氧化铟锡(ITO),并且已成为诸如智能手机和手表的触摸屏的近代每日寿命的广泛使用的材料,而且用作光学透明的低电阻在光伏行业的合同。最近ITO在电信频带中显示了epsilon - 近零(ENZ)行为,使得强大的索引调制和其他光学 - 异乎寻常的应用(如MetaTronics)。然而,由于ITO中的复杂内在效果,精确获得ITO中的靶向电气和光学材料特性的能力仍然具有挑战性,并且由于已经证明了迄今为止没有综合的MetaTronic平台。在这里,我们提供了RF-溅射的广泛和准确的描述参数,显示了可见光和特别近红外光谱区域中ITO薄膜质量的整体控制。我们能够通过明确地控制溅射过程条件来定制eNZ点跨电信频段。利用这种控制,我们设计基于集总电路元件的功能子波长级滤波器,朝向实现集成的METATRONIC设备和电路。

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