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Secondary scintillation yield from GEM and THGEM gaseous electron multipliers for direct dark matter search

机译:来自GEM和THGEM气态电子乘数的次级闪烁产量,用于直接暗物质搜索

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The search for alternatives to PMTs as photosensors in optical TPCs for rare event detection has significantly increased in the last few years. In particular, in view of the next generation large volume detectors, the use of photosensors with lower natural radioactivity, such as large area APDs or GM-APDs, with the additional possibility of sparse surface coverage, triggered the intense study of secondary scintillation production in micropattern electron multipliers, such as GEMs and THGEMs, as alternatives to the commonly used uniform electric field region between two parallel meshes. The much higher scintillation output obtained from the electron avalanches in such microstructures presents an advantage in those situations. The accurate knowledge of the amount of such scintillation is important for correct detector simulation and optimization. It will also serve as a benchmark for software tools developed and/or under development for the calculation of the amount of such scintillation.The secondary scintillation yield, or electroluminescence yield, in the electron avalanches of GEMs and THGEMs operating in gaseous xenon and argon has been determined for different gas pressures. At 1 bar, THGEMs deliver electroluminescence yields that are more than one order of magnitude higher when compared to those achieved in GEMs and two orders of magnitude when compared to those achieved in a uniform field gap. The THGEM electroluminescence yield presents a faster decrease with pressure when comparing to the GEM electroluminescence yield, reaching similar values to what is achieved in GEMs for xenon pressures of 2.5 bar, but still one order of magnitude higher than that produced in a uniform field gap. Another exception is the GEM operating in argon, which presents an electroluminescence yield similar to that produced in a uniform electric field gap, while the THGEM achieves yields that are more than one order of magnitude higher.
机译:搜索PMTS作为光学TPC中的光电传感器的替代品在过去几年中显着增加。特别地,鉴于下一代大容量探测器,使用具有较低天然放射性的光电传感器,例如大面积APD或GM-APD,具有稀疏表面覆盖的额外可能性,引发了次级闪烁生产的强烈研究微图案电子乘法器(例如GEMS和THGEM),作为两个平行网格之间的常用均匀电场区域的替代品。在这种微结构中的电子雪崩中获得的闪烁输出大大提出了这些情况的优点。对这种闪烁量的准确知识对于正确的检测器模拟和优化是重要的。它还将作为开发和/或正在开发的软件工具的基准,用于计算这种闪烁的量。在气态氙和氩气中操作的宝石和THGEM的电子雪崩中的次级闪烁产率或电致发光产量已经确定了不同的气体压力。在1巴中,与在均匀场间隙中实现的那些相比,THGEMS在与宝石中实现的那些相比,THGEMS提供多个数量级的电致发光产量,其数量级高。当与宝石电致发光产率相比,THGEM电致发光产量随压力的速度越来越快地减小,达到类似于2.5巴的氙气压力的宝石中所取得的类似值,但仍然比在均匀场间隙中产生的数量级。另一例例外是在氩气中操作的宝石,其呈现出类似于在均匀电场间隙中产生的电致发光产量,而THGEM实现了多于一种数量级的产量。

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