Photoluminescence of the integrating sphere walls, its influence on the absolute quantum yield measurements and correction methods

摘要

Determination of the absolute quantum yield (QY) of photoluminescence (PL) or electroluminescence is commonly performed using an integrating sphere (IS) – versatile device for radiometry applications. The key feature of IS is very high diffused reflectance of its internal surface. Two materials are commonly used: (a) the sintered high-density polytetrafluoroethylene (Spectralon) and (b) materials based on barium sulphate (Spectraflect). Using PL-micro-spectroscopy we show that both materials reveal PL from localized centers excitable by UV, blue and green light emitting broad PL spectrum extending up to the red spectral region. The main effect of PL from IS-walls is introduction of non-constant parasitic background which is mixed with PL from a tested sample during the QY measurements. We develop theoretical description of QY determination which includes effects of PL from IS walls. This allows us to propose and test a reliable and universal correction for the IS-related PL background. Finally, a method of “black sample” is proposed and applied to estimate PL QY of Spectraflect which is shown to decrease from 0.09 to 0.015% for excitation shift from 320 to 440 nm.