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Effects of Disorder on the Pressure-Induced Mott Transition in κ -(BEDT-TTF) 2 Cu[N(CN) 2 ]Cl

机译:病症对κ - (床TTF)2 Cu [N(CN)2] Cu的压力诱导的卷发转变的影响

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We present a study of the influence of disorder on the Mott metal-insulator transition for the organic charge-transfer salt κ -(BEDT-TTF) 2 Cu[N(CN) 2 ]Cl. To this end, disorder was introduced into the system in a controlled way by exposing the single crystals to X-ray irradiation. The crystals were then fine-tuned across the Mott transition by the application of continuously controllable He-gas pressure at low temperatures. Measurements of the thermal expansion and resistance show that the first-order character of the Mott transition prevails for low irradiation doses achieved by irradiation times up to 100 h. For these crystals with a moderate degree of disorder, we find a first-order transition line which ends in a second-order critical endpoint, akin to the pristine crystals. Compared to the latter, however, we observe a significant reduction of both, the critical pressure p c and the critical temperature T c . This result is consistent with the theoretically-predicted formation of a soft Coulomb gap in the presence of strong correlations and small disorder. Furthermore, we demonstrate, similar to the observation for the pristine sample, that the Mott transition after 50 h of irradiation is accompanied by sizable lattice effects, the critical behavior of which can be well described by mean-field theory. Our results demonstrate that the character of the Mott transition remains essentially unchanged at a low disorder level. However, after an irradiation time of 150 h, no clear signatures of a discontinuous metal-insulator transition could be revealed anymore. These results suggest that, above a certain disorder level, the metal-insulator transition becomes a smeared first-order transition with some residual hysteresis.
机译:我们展示了有机电荷 - 转移盐κ - (床T-TTF)2 Cu [N(CN)2] Cl的Mott金属 - 绝缘体转变对混乱的影响的研究。为此,通过将单晶暴露于X射线照射,以受控方式将病症引入系统中。然后通过在低温下施加连续可控的He-气体压力,通过在莫特的HOT转换上微调晶体。热膨胀和电阻的测量表明,通过辐照时间达到100h的照射剂量的低辐射剂量,莫特过渡的一阶特征普遍存在。对于具有中等性疾病程度的这些晶体,我们发现一个一阶的过渡线,其在二阶关键终点中结束,类似于原始晶体。然而,与后者相比,我们观察到临界压力P C和临界温度T C的显着减少。该结果与在存在强相关性和小疾病存在下的软豆间隙的理论上形成的理论上预测的形成。此外,我们示出了类似于原始样品的观察,其中50小时辐射后的Mott转变伴随着可大幅的晶格效应,其临界行为可以通过平均场理论很好地描述。我们的结果表明,Mott过渡的特征在低紊乱水平上基本上保持不变。然而,在照射时间为150小时之后,可以再现不连续金属绝缘体过渡的明显签名。这些结果表明,在某种障碍水平之上,金属绝缘体转变变为含有一些残留滞后的涂抹一阶转变。

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