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Highly Conductive Zinc Oxide Based Transparent Conductive Oxide Films Prepared using RF Plasma Sputtering Under Reducing Atmosphere

机译:基于高温等离子体溅射在还原气氛下使用RF等离子体溅射制备的高导电氧化锌基氧化锌膜

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The spectral properties and colour functions of a radio frequency (RF)-based sputtering plasma source was monitored during consecutive sputter deposition of zinc doped indium oxide (IZO) thin films under argon and argon/hydrogen mix. The effect of target exposure to the hydrogen gas on charge density/mobility and spectral transmittance of the deposited films was investigated. We demonstrate that consecutive exposure to the hydrogen gas during the deposition process progressively affects the properties of thin films with a certain degree of continuous improvement in electrical conductivity while demonstrating that reverting to only argon from argon/ hydrogen mix follows a complex pathway, which has not been reported previously in such detail to our knowledge. We then demonstrate that this effect can be used to prepare highly conductive zinc oxide thin films without indium presence and as such eliminating the need for the expensive indium addition. We shall demonstrate that complexity observed in emission spectra can be simply identified by monitoring the colour of the plasma through its colour functions, making this technique a simple real-time monitoring method for the deposition process.
机译:在氩气下的锌掺杂氧化铟(IZO)薄膜的连续溅射沉积期间监测射频(RF)的溅射等离子体源的光谱特性和颜色函数在氩气下和氩/氢气混合物下进行监测。研究了靶暴露于氢气对沉积膜的电荷密度/迁移率和光谱透射率的影响。我们证明,在沉积过程中连续暴露于氢气中逐渐影响薄膜的性质,其具有一定程度的导电性的连续改善,同时证明仅从氩/氢气混合物中再次逆转,遵循复杂的途径,这遵循复杂的途径以前向我们的知识提供了此类细节。然后,我们证明这种效果可用于制备高导电氧化锌薄膜而没有铟存在,并且例如消除对昂贵的铟添加的需要。我们将证明,在发射光谱中观察到的复杂性可以通过通过其颜色函数监测等离子体的颜色来简单地识别,使得该技术是沉积过程的简单实时监测方法。

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