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APS -APS March Meeting 2017 - Event - Nanoscale Thermal Mapping in Two-Dimensional Materials using Electron Energy Loss Spectroscopy (EELS)

机译:APS -APS 3月会议2017 - 事件 - 使用电子能损光谱(EEL)的二维材料中的纳米级热映射

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While 2D materials such as graphene and transition metal dichalcogenides (TMDs) are of significant interest for the applications in electronics and optoelectronics, heat removal in such devices can be detrimental to their performance and reliability. As the node sizes in such devices shrink, understanding the power dissipation and thermal transport properties in 2D materials requires thermometry techniques which can provide a nm-scale spatial resolution. Here, we introduce a method for measuring the local temperature gradients in low dimensional materials using a combination of scanning transmission electron microscope and electron energy loss spectroscopy (EELS). More specifically, we find a relationship between the plasmon energies and the sample temperatures for different free-standing 2D materials (graphene, MoS$_2$, MoSe$_2$, WS$_2$, WSe$_2$), which can now be used to map the temperature gradient across interfaces and particle surfaces. We also perform first-principles calculations for the low-loss EELS signal to interpret the experimental findings.
机译:虽然如石墨烯和过渡金属二甲基甲基(TMDS)的2D材料对电子和光电子中的应用具有显着兴趣,但在这种装置中的热除去可能对它们的性能和可靠性有害。当这些设备中的节点尺寸收缩时,理解2D材料中的功率耗散和热传输特性需要提供NM级空间分辨率的热量技术。这里,我们使用扫描透射电子显微镜和电子能损光谱(EEL)的组合来介绍一种测量低尺寸材料中局部温度梯度的方法。更具体地说,我们在不同的独立式2D材料的等离子体能量和样品温度之间找到了一种关系(石墨烯,MOS $ _2 $,MOSE $ _2 $,WS $ _2 $,WS $ _2 $),现在可以用于将温度梯度映射到界面和粒子表面上。我们还对低损耗EEL信号执行第一原理计算,以解释实验结果。

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