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APS -Annual Meeting of the APS Four Corners Section- Event - Maximizing the Magnetic Domain Morphologies in CoPt thin-films

机译:APS-APS四角分会年会-活动-最大化CoPt薄膜的磁畴形态

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I am doing research under Dr. Chesnel at Brigham Young University in Provo, Utah. The research involves studying the magnetic domain morphologies of CoPt thin-films ranging from 55-335 nanometers in thickness. In these CoPt~multilayer thin-films, the thickness of the individual Co layers varies in the samples from~0.4 to 6~nanometers and the thickness of the individual~Pt layer is 0.7 nanometers, these two layers repeat 50 times. My sample is 75 nm in total comprised of 0.8 nm thick layers of cobalt and 0.7 nm thick layers of platinum. I~will present~results for~a Co thickness of 8 Angstroms.~We used a Vibrating Sample Magnetometer (VSM)~to apply a strong magnetic field looping sequence to the sample before returning to net-zero magnetization. We then used an Atomic Force Microscope (AFM) to map the magnetic domains. We repeated this process, of~alternatively using the VSM and AFM, until we completed an ascending series from 0 Tesla to 9 Tesla.The densities of the magnetic domains of the individually and previously applied loops in each state were then analyzed. I am looking for the relationship between the magnitude of the previously applied magnetic field and the density of the magnetic domains in three different types of series.~These are ascending vs descending vs pumping.
机译:我正在犹他州普罗沃的杨百翰大学的Chesnel博士的带领下进行研究。该研究涉及研究CoPt薄膜厚度在55-335纳米之间的磁畴形态。在这些CoPt〜多层薄膜中,样品中各个Co层的厚度在〜0.4纳米至6纳米之间变化,并且各个Pt层的厚度为0.7纳米,这两层重复50次。我的样品总共为75 nm,包括0.8 nm厚的钴层和0.7 nm厚的铂层。我将得出〜Co厚度为8埃的结果。〜我们使用了振动样品磁强计(VSM)〜对样品施加了强磁场循环序列,然后返回到净零磁化。然后,我们使用原子力显微镜(AFM)来映射磁畴。我们重复这一过程,或者使用VSM和AFM,直到完成从0特斯拉到9特斯拉的升序为止。然后分析了每个状态下各个环路和先前施加的环路的磁畴密度。我正在寻找先前施加的磁场强度与三种不同类型的系列中磁畴密度之间的关系。〜这些是上升,下降,泵浦。

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