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首页> 外文期刊>Bulletin of the American Physical Society >APS -APS March Meeting 2017 - Event - Using sub-Kelvin thermal transport to determine electron-phonon coupling in a metallic thin film
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APS -APS March Meeting 2017 - Event - Using sub-Kelvin thermal transport to determine electron-phonon coupling in a metallic thin film

机译:APS -APS 2017年3月会议-活动-使用次开尔文热传输确定金属薄膜中的电子-声子耦合

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摘要

Steady-state thermal transport was measured in a thin film of the alloy Ti$_{0.1}$W$_{0.9}$ for temperatures ranging from approximately 100 mK to 500 mK. The electron temperature was measured using two normal metal-insulator-superconductor (NIS) junction thermometers. The temperature of the normal metal electrons was measured while changing the power applied to the normal metal thin film. The data were compared to the theoretically expected relationship, $P_{ep} = SigmaOmega(T_e^n-T_p^n)$, where $Sigma$ depends on the electron-phonon coupling, and $n$ is effected by the electron mean-free path and the thermal phonon wavevector.
机译:在大约100 mK至500 mK的温度范围内,在Ti __ {0.1} $ W $ _ {0.9} $合金薄膜中测量了稳态热传输。电子温度是使用两个常规的金属-绝缘体-超导体(NIS)结温度计测量的。在改变施加到普通金属薄膜的功率的同时测量普通金属电子的温度。将数据与理论期望的关系进行比较,$ P_ {ep} = SigmaOmega(T_e ^ n-T_p ^ n)$,其中$ Sigma $取决于电子-声子耦合,$ n $受电子均值的影响自由路径和热声子波矢。

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