首页> 外文期刊>Sensors >A Gradient-Field Pulsed Eddy Current Probe for Evaluation of Hidden Material Degradation in Conductive Structures Based on Lift-Off Invariance
【24h】

A Gradient-Field Pulsed Eddy Current Probe for Evaluation of Hidden Material Degradation in Conductive Structures Based on Lift-Off Invariance

机译:基于剥离不变性的梯度场脉冲涡流探头,用于评估导电结构中的隐藏材料降解

获取原文
           

摘要

Coated conductive structures are widely adopted in such engineering fields as aerospace, nuclear energy, etc. The hostile and corrosive environment leaves in-service coated conductive structures vulnerable to Hidden Material Degradation (HMD) occurring under the protection coating. It is highly demanded that HMD can be non-intrusively assessed using non-destructive evaluation techniques. In light of the advantages of Gradient-field Pulsed Eddy Current technique (GPEC) over other non-destructive evaluation methods in corrosion evaluation, in this paper the GPEC probe for quantitative evaluation of HMD is intensively investigated. Closed-form expressions of GPEC responses to HMD are formulated via analytical modeling. The Lift-off Invariance (LOI) in GPEC signals, which makes the HMD evaluation immune to the variation in thickness of the protection coating, is introduced and analyzed through simulations involving HMD with variable depths and conductivities. A fast inverse method employing magnitude and time of the LOI point in GPEC signals for simultaneously evaluating the conductivity and thickness of HMD region is proposed, and subsequently verified by finite element modeling and experiments. It has been found from the results that along with the proposed inverse method the GPEC probe is applicable to evaluation of HMD in coated conductive structures without much loss in accuracy.
机译:涂层导电结构已广泛应用于航空航天,核能等工程领域。在恶劣的腐蚀环境下,使用中的涂层导电结构易受保护涂层下隐蔽材料降解(HMD)的影响。强烈要求可以使用非破坏性评估技术对HMD进行非侵入式评估。鉴于梯度场脉冲涡流技术(GPEC)在腐蚀评估中优于其他非破坏性评估方法的优势,本文对GPEC用于HMD定量评估的探针进行了深入研究。 GPEC对HMD的响应的闭式表达是通过分析建模来制定的。通过涉及具有可变深度和电导率的HMD的仿真,引入并分析了GPEC信号中的剥离不变性(LOI),这使得HMD评估不受保护涂层厚度变化的影响。提出了一种快速逆方法,该方法利用GPEC信号中LOI点的大小和时间来同时评估HMD区域的电导率和厚度,随后通过有限元建模和实验进行了验证。从结果中发现,连同提出的反方法,GPEC探针可用于评估涂层导电结构中的HMD,而不会造成很多准确性的损失。

著录项

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号