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The High Performance Shape Memory Effect (HP-SME) in Ni Rich NiTi Wires: In Situ X-Ray Diffraction on Thermal Cycling

机译:富镍NiTi导线中的高性能形状记忆效应(HP-SME):热循环的原位X射线衍射

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A novel approach for using Shape Memory Alloys (SMA) was recently proposed and named highperformance shape memory effect (HP-SME). The HP-SME exploits the thermal cycling of stress-induced martensite for producing extremely high mechanical work with a very stable functional fatigue behaviour in Ni rich NiTi alloy. The latter was found to differ significantly from the functional fatigue behaviour observed for conventional SMA. This study was undertaken in order to elucidate the microstructural modifications at the basis of this particular feature. To this purpose, the functional fatigue was coupled to in situ Synchrotron Radiation X-Ray Diffraction, by recording patterns on wires thermally cycled by Joule effect under a constant applied stress (800 MPa). The accurate analysis the line profile XRD data suggests the accumulation of defects upon functional cycling, while the fibre texture was not observed to change. The functional fatigue exhibits a very similar behaviour as the line broadening of XRD peaks, thus suggesting the accumulation of dislocations as the origin of the mechanism of the permanent deformation.
机译:最近提出了一种使用形状记忆合金(SMA)的新颖方法,并将其称为高性能形状记忆效应(HP-SME)。 HP-SME利用应力诱发马氏体的热循环来产生极高的机械功,并在富镍的NiTi合金中具有非常稳定的功能疲劳行为。发现后者与常规SMA观察到的功能疲劳行为有显着差异。进行这项研究是为了阐明基于此特定特征的微观结构修改。为此,通过在恒定施加的应力(800 MPa)下通过焦耳效应热循环的导线上记录图案,将功能疲劳与原位同步辐射X射线衍射耦合。对线轮廓XRD数据的准确分析表明,功能循环时缺陷会累积,而未观察到纤维质地发生变化。功能疲劳表现出与XRD峰的线展宽非常相似的行为,因此表明位错的积累是永久变形机制的起源。

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