首页> 外文期刊>Genetics: A Periodical Record of Investigations Bearing on Heredity and Variation >High-Density Genetic Linkage Maps of Phytophthora infestans Reveal Trisomic Progeny and Chromosomal Rearrangements
【24h】

High-Density Genetic Linkage Maps of Phytophthora infestans Reveal Trisomic Progeny and Chromosomal Rearrangements

机译:疫霉疫霉的高密度遗传连锁图谱显示三体性后代和染色体重排

获取原文
           

摘要

Detailed analysis of the inheritance of molecular markers was performed in the oomycete plant pathogen Phytophthora infestans . Linkage analysis in the sexual progeny of two Dutch field isolates (cross 71) resulted in a high-density map containing 508 markers on 13 major and 10 minor linkage groups. The map showed strong clustering of markers, particularly of markers originating from one parent, and dissimilarity between the parental isolates on linkage group III in the vicinity of the mating-type locus, indicating a chromosomal translocation. A second genetic map, constructed by linkage analysis in sexual progeny of two Mexican isolates (cross 68), contained 363 markers and is thus less dense than the cross 71 map. For some linkage groups the two independent linkage maps could be aligned, but sometimes markers appeared to be in a different order, or not linked at all, indicating chromosomal rearrangements between genotypes. Graphical genotyping showed that some progeny contained three copies of a homologous linkage group. This trisomy was found for several linkage groups in both crosses. Together, these analyses suggest a genome with a high degree of flexibility, which may have implications for evolution of new races and resistance development to crop protection agents.
机译:详细的分子标记的遗传分析进行了卵菌植物病原疫霉。在两个荷兰田间分离株(71交)的有性后代中进行连锁分析,得到了一个高密度图,其中包含13个主要和10个次要连锁组上的508个标记。该图显示标记物,特别是起源于一个亲本的标记物的强聚集,以及在交配型基因座附近的连接基团III上的亲本分离物之间的相似性,表明染色体易位。第二个遗传图谱是通过对两个墨西哥分离株(68交叉)的有性后代进行连锁分析而构建的,包含363个标记,因此密度不如71交叉图。对于某些连锁群,两个独立的连锁图谱可以对齐,但有时标记似乎以不同的顺序排列,或者根本没有连锁,表明基因型之间的染色体重排。图形基因分型表明,一些子代包含一个同源连锁基团的三个拷贝。在两个杂交中的几个连锁基团中发现了这种三体性。总之,这些分析表明基因组具有高度的灵活性,这可能对新种族的进化以及对农作物保护剂的抗性发展有影响。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号