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Evaluating Bees Algorithm for Sequence-based T-way Testing Test Data Generation

机译:基于序列T道测试测试数据生成的评估蜜蜂算法

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T-way testing is a testing technique that is used to detect faults due to parameter interactions or software configurations. In order to perform t-way testing, software testers need to prepare the test data. For a system with many configuration parameters, the test data could lead to combinatorial explosion problem, since all possible parameter combinations need to be considered. Therefore, test data generation for t-way testing need to be optimized. Many t-way test data generation strategies have been proposed in the literature to generate optimized t-way test data. However, very few strategies have been proposed for sequence-based t-way. This paper presents statistical analysis on the performance of Bees Algorithm against the other sequence t-way strategies, in order to generate test cases.
机译:T-way测试是一种测试技术,用于检测由于参数交互作用或软件配置而引起的故障。为了执行t-way测试,软件测试人员需要准备测试数据。对于具有许多配置参数的系统,测试数据可能会导致组合爆炸问题,因为需要考虑所有可能的参数组合。因此,需要优化用于t-way测试的测试数据生成。文献中已经提出了许多t-way测试数据生成策略来生成优化的t-way测试数据。但是,针对基于序列的t-way提出的策略很少。本文提出了Bees算法相对于其他序列t-way策略的性能统计分析,以生成测试用例。

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