On the Graphitic Properties of Korean Anthracite () X-ray Diffraction Method as an Estimation of the Graphitic Properties of Anthracite

摘要

In the previous paper of the series of researches on the graphitic properties of anthracites, authors have already reported the results on the electrical specific resistance measurements for Korean anthracites in order to develope a simple methods which differentiate graphite from anthracite. In this paper, the X-ray diffraction method and oxidation have been applied and compared with the results which were obtained by the specific resistance measurements in the previous paper. It has been confirmed that there is a parallel relation between the value of specific resistance measurement and height of hexagonal peak by X-ray diffraction, but the color reaction due to graphitic acid by oxidation does not show any definite critical points between graphite and anthracite.