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Barrier SiO2-like coatings for archaeological artefacts preservation

机译:用于考古文物保存的类SiO2阻挡涂层

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Thinfilmchemicalvapourdepositiontechniquehasbeenusedformorethan50years.Introducingorgano-siliconesasprecursors,e.g.hexamethyldisiloxane(HMDSO)ortetraethylorthosilicate(TEOS),broughtnewpossibilitiestothismethod.Barrierpropertiesofthinfilmshavebecomeanimportantissue,especiallyforarmyandemergencyservicesaswellasforfoodanddrinkmanufacturers.OurworkisfocusedonprotectiveHMDSOthinfilmsforencapsulatingcleanedarchaeologicalartefacts,preventingthecorrosionfromdestroyingthesehistoricalitems.Thinfilmsaredepositedviaplasmaenhancedchemicalvapourdeposition(PECVD)techniqueusinglowpressurecapacitivelycoupledpasmainflowregime.Oxygentransmissionrate(OTR)measurementwaschosenasthemostimportantoneforcharacterizationofbarrierpropertiesofdepositedthinfilms.LowestOTRreachedfor50nmthinfilmthicknesswas120cm3m-2atm-1day-1.SampleswerealsoanalyzedbyFourierTransformInfraredspectrometry(FTIR)todeterminetheircomposition.Opticalemissionspectraandthinfilmthicknessweremeasuredduringthedepositionprocess.Weoptimizedthedepositionparametersforbarrierlayersbyimplementationofpulsedmodeofplasmaandargonplasmapre-treatmentintotheprocess...
机译:Thinfilmchemicalvapourdepositiontechniquehasbeenusedformorethan50years.Introducingorgano-siliconesasprecursors,eghexamethyldisiloxane(HMDSO)ortetraethylorthosilicate(TEOS),broughtnewpossibilitiestothismethod.Barrierpropertiesofthinfilmshavebecomeanimportantissue,especiallyforarmyandemergencyservicesaswellasforfoodanddrinkmanufacturers.OurworkisfocusedonprotectiveHMDSOthinfilmsforencapsulatingcleanedarchaeologicalartefacts,preventingthecorrosionfromdestroyingthesehistoricalitems.Thinfilmsaredepositedviaplasmaenhancedchemicalvapourdeposition(PECVD)techniqueusinglowpressurecapacitivelycoupledpasmainflowregime.Oxygentransmissionrate(OTR)measurementwaschosenasthemostimportantoneforcharacterizationofbarrierpropertiesofdepositedthinfilms.LowestOTRreachedfor50nmthinfilmthicknesswas120cm3m-2ATM-1天-1.SampleswerealsoanalyzedbyFourierTransformInfraredspectrometry(FTIR)确定其组成。在沉积过程中测量光学发射光谱和薄膜厚度。我们优化了沉积通过在工艺中实施等离子和氩等离子体的脉冲模式预处理来设置屏障层的参数...

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