Study of the ionization processes at the delay stage of the subnanosecond discharge in high-pressure nitrogen

摘要

This paper reports on a particle-in-cell and Monte Carlo simulations of the development of a pulsed breakdown in a high-pressure (40 atm) nitrogen-filled diode at an initially homogeneous electric field. The simulation shows that even during the formation of a conducting plasma channel, the diode can experience a current flow capable of greatly decreasing the diode voltage compared to its value in idle mode.