Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179

Ameet Chavan; Eric Bozeman; Eric MacDonald; Joseph Neff; Praveen Palakurthi

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Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179

机译：针对亚阈值操作进行了优化的辐射硬化触发器的重离子表征。 J.低功率电子。应用2012，2，168-179

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来源
《Journal of Low Power Electronics and Applications》 |2012年第4期|共1页
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Ameet Chavan; Eric Bozeman; Eric MacDonald; Joseph Neff; Praveen Palakurthi;
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1. Hardened Flip-Flop Optimized for Subthreshold Operation Heavy Ion Characterization of a Radiation [J] . Ameet Chavan, Eric Bozeman, Eric MacDonald, Journal of Low Power Electronics and Applications . 2012,第2期

机译：针对亚阈值操作辐射的重离子表征而优化的硬化触发器
2. Comment on “Optimization of power and efficiency of thermoelectric devices with asymmetric thermal contacts” [J. Appl. Phys. 111, 024509 (2012)] [J] . Lin Bihong Journal of Applied Physics . 2013,第17期

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3. Erratum: 'Ion irradiation of electronic-type-separated single wall carbon nanotubes: A model for radiation effects in nanostructured carbon' [J. Appl. Phys. 112, 034314 (2012)] [J] . Jamie E. Rossi, Cory D. Cress, Alysha R. Helenic, Journal of Applied Physics . 2012,第11期

机译：勘误表：“电子类型分离的单壁碳纳米管的离子辐照：纳米结构碳中辐射效应的模型” [J.应用物理112，034314（2012）]
4. A Low-Overhead Radiation Hardened Flip-Flop Design for Soft Error Detection [C] . Jie Li, Li-Yi Xiao, Hong-Chen Li, IEEE International Conference on Solid-State and Integrated Circuit Technology . 2018

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5. Fault tolerant flip-flop design for ultra-low power subthreshold logic. [D] . Dukle, Gaurav Avadhut. 2007

机译：容错触发器设计用于超低功耗亚阈值逻辑。
6. A Radiation-Hardened SAR ADC with Delay-Based Dual Feedback Flip-Flops for Sensor Readout Systems [O] . Duckhoon Ro, Changhong Min, Myounggon Kang, 2020

机译：具有基于延迟的双反馈触发器的防辐射SAR ADC用于传感器读出系统
7. Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179 [O] . Joseph Neff, Eric MacDonald, Praveen Palakurthi, 2012

机译：针对亚阈值操作优化的抗辐射触发器的重离子表征。 J.低功率电子。申请2012,2,168-179

Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179

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