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首页> 外文期刊>Japanese heart journal >Long-Term Follow Up of Ventricular Endocardial Pacing LeadsComplications, Electrical Performance, and Longevity of 561 Right Ventricular Leads
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Long-Term Follow Up of Ventricular Endocardial Pacing LeadsComplications, Electrical Performance, and Longevity of 561 Right Ventricular Leads

机译:心室心律起搏导线的长期随访并发症,561条右心室导线的电性能和寿命

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Five hundred and sixty-one endocardial pacing leads implanted in the right ventricle of 502 patients between 1971 and 1990 were followed for up to 17 years regarding their complications, stimulation threshold behavior, and overall longevity.Lead tip dislodgement occurred in 16 leads (2.9%), in 14 of which dislodgement occurred within 2 months after implantation. The incidence of dislodgement was significantly smaller in tined leads than in nontined leads. Lead conductor fracture occurred in 19 leads (3.4%), in 15 of which fracture occurred within 5 years after implantation. Two particular sites of lead fracture were identified; i.e., one within the pacemaker pocket and the other at a particular point in the subclavian vein between the clavicle and the first rib. Fixation ligature in the former site and the venopuncture point for lead insertion in the latter site are thought to be related to lead fracture.Other complications included insulator break in 3 leads (0.5%), exit block in 7 leads (1.2%), and poor sensing in 2 leads (0.4%).The cumulative survival of leads was 94.1±2.7% (mean±95% confidence interval) at 5 years, 86.3±6.3% at 10 years, and 74.2±14.0% at 15 years after implantation.The minimal stimulation threshold, lead impedance and R wave amplitude were all found to be stable for up to 10 years, and there were no tendencies toward higher stimulation threshold during the observation period of this study.
机译:1971年至1990年间,共对502例患者的右心室植入了561条心内膜起搏导线,并对其并发症,刺激阈值行为和总体寿命进行了长达17年的追踪研究,其中16根导线发生了尖端脱位(2.9%) ),其中14例在植入后2个月内发生移位。镀锡引线的位移发生率显着低于非镀锡引线。引线导体断裂发生在19条引线中(3.4%),其中15条发生在植入后5年内。确定了两个特定的铅断裂部位:也就是说,一个位于起搏器口袋内,另一个位于锁骨下静脉与锁骨和第一肋骨之间的特定点。前者的固定结扎和后者的静脉穿刺点被认为与导线断裂有关,其他并发症包括3根导线的绝缘子断裂(0.5%),7根导线的出口阻塞(1.2%)和2条导线的感知不良(0.4%)。植入后5年导线的累积存活率为94.1±2.7%(平均±95%置信区间),植入10年时为86.3±6.3%,植入后15年为74.2±14.0%在本研究的观察期内,最小刺激阈值,导线阻抗和R波幅值都可以保持稳定长达10年,并且没有向更高刺激阈值发展的趋势。

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