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首页> 外文期刊>The Journal of Engineering >Grid topology and technology influences on selective protection concepts for multi-terminal medium voltage DC grids
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Grid topology and technology influences on selective protection concepts for multi-terminal medium voltage DC grids

机译:电网拓扑和技术对多端子中压直流电网选择性保护概念的影响

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The integration of distributed renewable energy resources in combination with advancements in power electronics make the application of multi-terminal medium voltage DC grids a promising and flexible solution. Fast and selective protection concepts in combination with DC (disconnecting) switches for fault handling are required to ensure high reliability and safe grid operation of these systems. Medium voltage DC grids may be realised based on several converter technologies with different fault clearing capability. Depending on the converter technology, switches for isolating faulted branches or DC circuit breakers (CBs) for fault clearance become necessary. DC medium voltage CB concepts have already been proposed. However, the switching times of these CBs vary significantly depending on the presence or absence of mechanical components resulting in different requirements for fault detection. This contribution evaluates the relations between different converter and DC CB technologies, DC grid topologies and fault detection methods according to selective fault clearing. Transient simulation studies are carried out for the development of protection concepts. Based on the results, reasonable technological combinations of the above-mentioned technologies are identified. Special consideration is given to the dimensioning of series reactors as fault current rise limiting devices.
机译:分布式可再生能源的整合以及电力电子技术的进步,使得多端子中压直流电网的应用成为一种有前途的灵活解决方案。为了确保这些系统的高可靠性和安全的电网运行,需要快速且有选择性的保护概念与用于故障处理的DC(隔离)开关相结合。中压直流电网可以基于几种具有不同故障清除能力的变频器技术来实现。根据转换器技术的不同,有必要使用用于隔离故障分支或直流断路器(CB)的开关来清除故障。直流中压CB概念已经被提出。但是,这些CB的开关时间会根据是否存在机械组件而发生显着变化,从而导致对故障检测的不同要求。根据选择性的故障清除,此贡献评估了不同转换器和DC CB技术,DC电网拓扑和故障检测方法之间的关系。为了保护概念的发展进行了瞬态仿真研究。根据结果​​,确定了上述技术的合理技术组合。作为故障电流上升限制装置,应特别考虑串联电抗器的尺寸。

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