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Preparation and investigation of optical, structural, and morphological properties of nanostructured ZnO:Mn thin films

机译:纳米ZnO:Mn薄膜的制备,光学,结构和形貌研究

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Nanostructured ZnO:Mn thin films have been prepared by sola€“gel dip coating method. The content of Mn in the sol was varied from 0 to 12 wt%. The effect of Mn concentration on the optical, structural, and morphological properties of ZnO thin films were studied by using Fourier transform infrared (FTIR), UVa€“visible and photoluminescence (PL) spectroscopy, X-ray diffraction (XRD) and scanning electron microscopy (SEM). XRD results showed that the films have hexagonal wurtzite structure at lower content of Mn. The diffraction peaks corresponding to ZnO disappeared and two diffraction peaks of MnO2 and Mn3O4 appeared at the highest value of doping concentration (viz., 12 wt%). SEM results revealed that the surface smoothness of the films improved at higher content of Mn. The optical band gap of the films decreased from 3.89 to 3.15 eV when the Mn concentration increased from 0 to 12 wt%. The PL spectra of the films showed the characteristic peaks linked to band-to-band, green and yellow emissions. Besides, the PL intensity of the samples decreased with increase in Mn concentration.
机译:纳米结构的ZnO:Mn薄膜是通过溶胶凝胶浸涂法制备的。溶胶中的Mn含量为0〜12重量%。利用傅立叶变换红外光谱(FTIR),紫外可见光致发光(PL)光谱,X射线衍射(XRD)和扫描电子研究了Mn浓度对ZnO薄膜的光学,结构和形态特性的影响。显微镜(SEM)。 XRD结果表明,在较低的Mn含量下,薄膜具有六方纤锌矿结构。对应于ZnO的衍射峰消失,并且在掺杂浓度的最高值(即12wt%)处出现了MnO 2和Mn 3 O 4的两个衍射峰。 SEM结果表明,当Mn含量较高时,薄膜的表面光滑度提高。当Mn浓度从0增加到12 wt%时,薄膜的光学带隙从3.89下降到3.15 eV。薄膜的PL光谱显示出与峰间发射,绿色和黄色发射相关的特征峰。此外,样品的PL强度随Mn浓度的增加而降低。

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