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首页> 外文期刊>Physical Review. Accelerators and Beams >Micron-scale laser-wire scanner for the KEK Accelerator Test Facility extraction line
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Micron-scale laser-wire scanner for the KEK Accelerator Test Facility extraction line

机译:用于KEK加速器测试设施提取线的微米级激光线扫描仪

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A laser-wire transverse electron beam size measurement system has been constructed and operated at the Accelerator Test Facility (ATF) extraction line at KEK. The construction of the system is described in detail along with the environment of the ATF related to the laser wire. A special set of electron beam optics was developed to generate an approximately $1ext{ }ext{ }ensuremath{mu}mathrm{m}$ vertical focus at the laser-wire location. The results of our operation at the ATF extraction line are presented, where a minimum rms electron beam size of $4.8ifmmodepmelseextpmi{}0.3ext{ }ext{ }ensuremath{mu}mathrm{m}$ was measured, and smaller electron beam sizes can be measured by developing the method further. The beam size at the laser-wire location was changed using quadrupoles and the resulting electron beam size measured, and vertical emittance extracted.
机译:已在KEK的加速器测试设施(ATF)提取线上建造并运行了激光线横向电子束尺寸测量系统。详细描述了系统的结构以及与激光线有关的ATF的环境。开发了一套特殊的电子束光学器件,以在激光线位置产生大约$ 1 text {} text {} ensuremath { mu} mathrm {m} $垂直焦点。给出了我们在ATF提取线上的操作结果,其中最小均方根电子束大小为$ 4.8 ifmmode pm else textpm fi {} 0.3 text {} text {} ensuremath { mu} 通过测量mathrm {m} $,可以通过进一步开发该方法来测量更小的电子束尺寸。使用四极杆改变激光线位置的束大小,并测量所得的电子束大小,并提取垂直发射率。

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