Characterization of Superconducting Magnesium-Diboride Films on Glassy Carbon and Sapphire Substrates

摘要

IBA methods were applied to measure elemental depth profiles of precursors and superconducting MgB2 thin films deposited on glassy carbon (Good Fellows) and sapphire (Al2O3) substrates. For each type of substrates we obtained a pair of samples i.e. one amorphous precursor and one superconducting film which were then characterized. A 3He+ beam was used to bombard both, precursors and superconducting films in order to obtain the samples elemental composition profiles. The zero resistance Tcoand the middle of transition Tcm values were 26.0K and 29.7K for the MgB2 film deposited on glassy carbon substrate. In the case of sapphire substrate the Tco and Tcm values were 25.0K and 27.9K, respectively.