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Design of Low Complexity Fault Detection Scheme for AES using Composite Field Arithmetic

机译:基于复合场算法的AES低复杂度故障检测方案设计

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摘要

The Advanced Encryption Standard (AES) is the symmetric cryptography standard that can be used to protect the electronic data. The natural and malicious injected faults may cause confidential information leakage and also reduce its reliability. In this study, we have explained a low complexity fault detection schemes for the AES architecture. The proposed work is low-complexity fault detection schemes using composite fields in polynomial basis for the AES encryption and decryption. These schemes are independent of the existing S-box and inverse S-box constructed. Here we have developed a new technique for the fault detection of subbyte and inverse subbyte using multiplicative inversion and affine transformation of the S-box and the inverse S-box. These are constructed in S-box and the inverse S-box. So this scheme can be used for the S-boxes and the inverse S-boxes in composite fields subbyte and inverse subbyte and using ROM. The proposed AES Fault detection scheme is coded in VHDL (Very High Speed Integrated Circuits Hardware Description Language), synthesized and simulated using EDA (Electronic Design Automation) tool-XilinxISEVirtex FPGA (http://www.xilinx.com/.). Finally the results are compared with Conventional ROM based subbyte and inverse subbyte to show the significant improvement in its efficiency in terms of path delay, speed and area.
机译:高级加密标准(AES)是对称加密标准,可用于保护电子数据。自然和恶意注入的故障可能会导致机密信息泄漏,并降低其可靠性。在这项研究中,我们已经解释了用于AES体系结构的低复杂度故障检测方案。拟议的工作是使用多项式复合字段进行AES加密和解密的低复杂性故障检测方案。这些方案与现有的S-box和逆S-box无关。在这里,我们开发了一种新的技术,该技术使用S-box和S-box的乘法倒数和仿射变换对子字节和反子字节进行故障检测。这些是在S-box和逆S-box中构造的。因此,该方案可用于复合字段子字节和反子字节中的S盒和反S盒,并使用ROM。提议的AES故障检测方案以VHDL(超高速集成电路硬件描述语言)编码,并使用EDA(电子设计自动化)工具XilinxISEVirtex FPGA(http://www.xilinx.com/)进行综合和仿真。最后,将结果与基于常规ROM的子字节和反子字节进行比较,以显示其在路径延迟,速度和面积方面的效率有了显着提高。

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