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Standard method for microCT-based additive manufacturing quality control 3: Surface roughness

机译:基于microCT的增材制造质量控制的标准方法3:表面粗糙度

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The use of microCT of 10?mm coupon samples produced by AM has the potential to provide useful information of mean density and detailed porosity information of the interior of the samples. In addition, the same scan data can be used to provide surface roughness analysis of the as-built surfaces of the same coupon samples. This can be used to compare process parameters or new materials. While surface roughness is traditionally done using tactile probes or with non-contact interferometric techniques, the complex surfaces in AM are sometimes difficult to access and may be very rough, with undercuts and may be difficult to accurately measure using traditional techniques which are meant for smoother surfaces. This standard workflow demonstrates on a coupon sample how to acquire surface roughness results, and compares the results from roughly the same area of the same sample with tactile probe results. The same principle can be applied to more complex parts, keeping in mind the resolution limit vs sample size of microCT.
机译:使用AM生产的10?mm试样样品的microCT可以提供有用的平均密度信息和样品内部详细的孔隙率信息。另外,相同的扫描数据可用于提供相同试件样品的已建成表面的表面粗糙度分析。可用于比较工艺参数或新材料。传统上,表面粗糙度是使用触觉探针或非接触式干涉技术完成的,但AM中的复杂表面有时难以进入且可能非常粗糙,带有底切,并且可能难以使用旨在使表面更平滑的传统技术准确测量表面。这个标准的工作流程演示了在试样样品上如何获取表面粗糙度结果,并将来自相同样品的大致相同区域的结果与触觉探针结果进行了比较。可以将相同的原理应用于更复杂的零件,同时要记住microCT的分辨率极限与样本大小。

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