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Statistical Analysis of Partial Discharges in SF 6 Gas via Optical Detection in Various Spectral Ranges

机译:SF 6气体部分光谱范围内光学检测的局部放电统计分析

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Partial discharge (PD) detection is essential to the operation of high-voltage systems. In this context, we investigate the basic characteristics of light emission during PDs in SF 6 gas from the perspective of insulation diagnosis. A synchronous system is constructed using three optical photoelectric instruments with separate wavelength responses in the ultraviolet (UV, 189–352 nm), visible (VIS, 381–675 nm), and near-infrared (NIR, 737–920 nm) spectral ranges and a wide-band PD current pulse detector with a response of 1 pC. The results indicate that light emission depends upon the type of insulation defect and discharge energy. An increase in PD charge gives rise to more components in the spectral range from UV to VIS, and the presence of an insulator surface in discharges yields a more complex VIS-to-NIR spectrum. The phase-resolved partial discharge pattern (PRPD) of UV light pulses can reasonably reflect the electroluminescence process in the presence of the insulator surface and weak corona at negative voltage points. The PRPD of VIS light describes the features of the actual PD pattern in most cases. In comparison with the other two spectral ranges, light intensity in the VIS range is more sensitive to changes in gas-pressure-normalized voltage ( V rms / p ). The linear fitting analysis of the relationships between the light intensity and PD charge shows that UV light detection has a greater sensitivity to the PD charge and that UV detection exhibits a greater degree of linearity. NIR detection is applicable only to severe PDs. We believe that our findings can significantly aid in application of optical PD diagnosis in SF 6 gas insulated systems.
机译:局部放电(PD)检测对于高压系统的运行至关重要。在这种情况下,我们将从绝缘诊断的角度研究SF 6气体中局部放电期间发光的基本特征。使用三台光学光电仪器构建一个同步系统,该仪器在紫外线(UV,189–352 nm),可见光(VIS,381–675 nm)和近红外(NIR,737–920 nm)光谱范围内具有独立的波长响应宽带PD电流脉冲检测器,其响应为1 pC。结果表明,发光取决于绝缘缺陷的类型和放电能量。 PD电荷的增加会在从UV到VIS的光谱范围内增加分量,并且放电中存在绝缘体表面会产生更复杂的VIS-NIR光谱。在存在绝缘子表面和负电压点的弱电晕的情况下,UV光脉冲的相分辨局部放电模式(PRPD)可以合理地反映电致发光过程。在大多数情况下,VIS灯的PRPD描述了实际PD模式的特征。与其他两个光谱范围相比,VIS范围内的光强度对气压标准化电压(V rms / p)的变化更为敏感。对光强度和PD电荷之间关系的线性拟合分析表明,紫外线检测对PD电荷具有更高的灵敏度,并且紫外线检测具有更高的线性度。 NIR检测仅适用于严重的PD。我们相信,我们的发现可以极大地帮助光学PD诊断在SF 6气体绝缘系统中的应用。

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