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Arithmetic circuits: A chasm at depth three

机译:算术电路:深度三处的鸿沟

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We show that, over Q, if an n-variate polynomial of degree d=nO(1) is computable by an arithmetic circuit of size s (respectively by an algebraic branching program of size s) then it can also be computed by a depth three circuit (i.e. a -circuit) of size exp(dlogdlognlogs) (respectively of size exp(dlognlogs) ). In particular this yields a circuit of size exp(dlogd) computing the dd determinant Detd. It also means that if we can prove a lower bound of exp((dlog32d)) on the size of any -circuit computing the dd permanent Permd then we get superpolynomial lower bounds for the size of any arithmetic circuit computing Permd. We then give some further results pertaining to derandomizing polynomial identity testing and circuit lower bounds. The circuits that we construct have the property that (some of) the intermediate polynomials have degree much higher than d. Indeed such a counterintuitive construction is unavoidable - it is known that in any circuit C computing either Detd or Permd, if every multiplication gate has fanin at most d (or any constant multiple thereof) then C must have size at least exp((d)).
机译:我们证明,在Q上,如果可以通过大小为s的算术电路(分别通过大小为s的代数分支程序)计算出度为d = nO(1)的n元多项式,则也可以通过深度来计算大小为exp(dlogdlognlogs)(分别为大小exp(dlognlogs))的三个电路(即-电路)。特别地,这产生了计算dd行列式Detd的大小为exp(dlogd)的电路。这也意味着,如果我们可以证明在计算dd永久Permd的任何电路的大小上exp((dlog32d))的下界,那么对于任何计算Permd的算术电路的大小,我们都将获得超多项式下界。然后,我们给出与去随机化多项式身份测试和电路下限有关的其他结果。我们构造的电路具有(某些)中间多项式具有比d高得多的程度的性质。实际上,这种违反直觉的结构是不可避免的-众所周知,在任何计算Detd或Permd的电路C中,如果每个乘法门最多具有fanin d(或其任何常数倍),则C的大小必须至少为exp((d) )。

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