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EBSD- and ECCI-based Assessments of Inhomogeneous Plastic Strain Evolution Coupled with Digital Image Correlation

机译:基于EBSD和ECCI的不均匀塑性应变演化与数字图像相关性的评估

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We measured the local grain orientation gradient and dislocation density using electron backscatter diffraction (EBSD) measurement and electron channeling contrast imaging (ECCI) to obtain strain maps near a stress concentration source in pure nickel (Ni) as a face-centered cubic (FCC) model sample. In particular, we obtained the relationship amongst the grain orientation spread (GOS), dislocation density, and equivalent plastic strain on the sample surface, which were obtained by EBSD, ECCI, and digital image correlation (DIC), respectively. After obtaining the GOS-strain and dislocation density-strain relationships, the strain distribution in the interior of the sample was also determined by measuring the GOS and dislocation density, which were linearly correlated. The dislocation density-strain relationship exhibited a relatively small deviation.
机译:我们使用电子背散射衍射(EBSD)测量和电子通道对比成像(ECCI)测量了局部晶粒取向梯度和位错密度,以获得应力集中源附近的纯镍(Ni)作为面心立方(FCC)的应变图。模型样本。特别地,我们获得了分别通过EBSD,ECCI和数字图像相关性(DIC)获得的样品表面晶粒取向扩展(GOS),位错密度和等效塑性应变之间的关系。在获得GOS-应变和位错密度-应变关系后,还通过测量线性相关的GOS和位错密度来确定样品内部的应变分布。位错密度-应变关系表现出较小的偏差。

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