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Effect of Thiourea on the Nanocrystalline-Copper Coating Prepared by Jet Electrodeposition

机译:硫脲对喷射电沉积纳米铜涂层的影响

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Jet electrodeposition with the aid of thiourea was proposed in this paper to improve the deposition qualityof copper coatings. The effects of the content in the electrolyte on the coating microstructures,morphologies and mechanical performances were examined. The results show that a densenanocrystalline copper coating is fabricated with 10 mg/L thiourea addition. The average crystal sizeattains 29 nm. The preferred crystal orientation varies from (111) to (220) as the thiourea content in theelectrolyte rises to 10 mg/L from 5 mg/L. The microhardness increases by 81%, and the tensile strengthincreases by 51%, using current density 400 A/dm 2 and at the thiourea concentration 10 mg/L.
机译:为了提高铜镀层的沉积质量,提出了使用硫脲进行喷射电沉积的方法。考察了电解液中的含量对涂层微观结构,形貌和力学性能的影响。结果表明,通过添加10 mg / L硫脲可以制备致密的纳米晶铜涂层。平均晶体尺寸为29nm。随着电解质中硫脲的含量从5 mg / L增加到10 mg / L,优选的晶体取向从(111)到(220)变化。在电流密度为400 A / dm 2且硫脲浓度为10 mg / L的情况下,显微硬度增加81%,抗拉强度增加51%。

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