首页> 外文期刊>Information Technology Journal >Study on Discrete Spectrum Correction Technology of RLC Measuring Instrument
【24h】

Study on Discrete Spectrum Correction Technology of RLC Measuring Instrument

机译:RLC测量仪的离散频谱校正技术研究

获取原文
           

摘要

RLC measuring principle based on discrete spectrum analysis is proposed. RLC is abbreviations of resistance, inductance and capacitance. The value of complex impedance is obtained by gathering sinusoidal voltage and sinusoidal current flowing through impedance measuring synchronously and taking FFT to the signal gathered. By researching on the source of errors in RLC measurement based on the analysis of discrete spectrum, discrete spectrum correction technology which can reduce errors in RLC measurement is proposed. Discrete spectrum correction technology is made of frequency correction, amplitude correction and phase correction. The precision of RLC measuring instrument is improved greatly by using ratio formula correction method based on rectangular window.
机译:提出了基于离散频谱分析的RLC测量原理。 RLC是电阻,电感和电容的缩写。复阻抗的值是通过同步采集流经阻抗测量的正弦电压和正弦电流并对采集到的信号进行FFT得出的。通过在离散频谱分析的基础上研究RLC测量的误差源,提出了一种可以减少RLC测量误差的离散频谱校正技术。离散频谱校正技术由频率校正,幅度校正和相位校正组成。通过使用基于矩形窗口的比率公式校正方法,可以大大提高RLC测量仪器的精度。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号