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Design Challenges of SiC Devices for Low- and Medium-Voltage DC-DC Converters

机译:中低电压DC-DC转换器SiC器件的设计挑战

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Silicon carbide (SiC) devices are considered as key enablers for the development of highly efficient and compact dc-dc converters for low- and medium-voltage applications. Besides their high temperature capability and low conduction losses, they provide superior switching characteristics. This paper emphasizes the design challenges of SiC devices in the low- and medium-voltage ranges arising from their fast switching speeds. First, detailed measurement results on the switching characteristics of 1200 V SiC devices and the different leakage inductances are presented. The results are assessed with regard to the switching losses as well as the transient voltage and current overshoots. The impact on the switching behavior as a function of leakage inductances is shown. The leakage inductances also influence the resonance frequency of the power module and dc-dc converters. The determination of the size of the EMI filters is a crucial design aspect. Its significance is demonstrated using an 800 V dc-dc converter with commercially available SiC MOSFETs. In addition, zero-voltage switching is emphasized to reduce the impact of the parasitic elements of the module on the switching behavior. However, the performance of 10 kSiC SiC MOSFETs in a medium-voltage dc-dc converter shows that a significant amount of commutation energy is required to ensure a successful soft-switching transition.
机译:碳化硅(SiC)器件被认为是为中低压应用开发高效且紧凑的DC-DC转换器的关键推动力。除了具有高温能力和低传导损耗外,它们还提供了出色的开关特性。本文重点介绍了由于SiC器件的快速开关速度而在中低压范围内的设计挑战。首先,给出了有关1200 V SiC器件的开关特性和不同漏电感的详细测量结果。根据开关损耗以及瞬态电压和电流过冲评估结果。显示了对开关行为的影响,该影响是漏感的函数。漏感也会影响电源模块和DC-DC转换器的谐振频率。 EMI滤波器尺寸的确定是至关重要的设计方面。使用具有市售SiC MOSFET的800 V dc-dc转换器可以证明其重要性。另外,强调零电压开关以减少模块的寄生元件对开关行为的影响。但是,在中压DC-DC转换器中10 kSiC SiC MOSFET的性能表明,需要大量的换向能量以确保成功进行软开关转换。

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