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Structural, magnetic, and ferroelectric properties of T-like cobalt-doped BiFeO3 thin films

机译:T型钴掺杂BiFeO3薄膜的结构,磁性和铁电性质

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We present a comprehensive study of the physical properties of epitaxial cobalt-doped BiFeO3 films ~50 nm thick grown on (001) LaAlO3 substrates. X-ray diffraction and magnetic characterization demonstrate high quality purely tetragonal-like (T′) phase films with no parasitic impurities. Remarkably, the step-and-terrace film surface morphology can be fully recovered following a local electric-field-induced rhombohedral-like to T′ phase transformation. Local switching spectroscopy experiments confirm the ferroelectric switching to follow previously reported transition pathways. Critically, we show unequivocal evidence for conduction at domain walls between polarization variants in T′-like BFO, making this material system an attractive candidate for domain wall-based nanoelectronics.
机译:我们对(001)LaAlO 3 衬底上生长的50nm厚的掺钴BiFeO 3 薄膜的物理性能进行了全面的研究。 X射线衍射和磁表征表明,高质量的纯四方相(T')相膜没有寄生杂质。值得注意的是,在局部电场诱导的菱形样到T'相转变之后,台阶和台阶膜的表面形态可以完全恢复。局部开关光谱实验证实了铁电开关遵循先前报道的过渡路径。至关重要的是,我们显示出明确的证据表明在类似T'的BFO中极化变体之间的畴壁处导电,这使该材料系统成为基于畴壁的纳米电子学的诱人候选人。

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