Susceptibility and hardening of electronic systems to fast transient threats: new challenges ahead

摘要

The field of susceptibility and hardening of electronicsystems to transient threats has experienced a significantgrowth during the past ten years. Driven by the developmentin the area of non-lethal electromagnetic weapons ithas become necessary to extend the classical set of transientthreats, consisting of LEMP, ESD and NEMP, by a fast transientthreat with an extreme bandwidth. The investigation ofthe susceptibility to those UWB threats, characterized by abandwidth of more than a quarter of the center frequency, risetimes of less than 200 ps and pulse durations in the ns regime,is of special interest. This paper presents an overview of currentchallenges of the hardening against UWB threats. It discussesrecent research trends in transient susceptibility measurements,protection concepts and methods of analysis.