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A first approach to the distortion analysis of nonlinear analog circuits utilizing X-parameters

机译:利用X参数进行非线性模拟电路失真分析的第一种方法

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In this contribution a first approach to the distortion analysis of nonlinear 2-port-networks with X-parameterssup1/sup is presented. The X-parameters introduced by Verspecht and Root (2006) offer the possibility to describe nonlinear microwave 2-port-networks under large signal conditions. On the basis of X-parameter measurements with a nonlinear network analyzer (NVNA) behavioral models can be extracted for the networks. These models can be used to consider the nonlinear behavior during the design process of microwave circuits. The idea of the present work is to extract the behavioral models in order to describe the influence of interfering signals on the output behavior of the nonlinear circuits. Hereby, a simulator is used instead of a NVNA to extract the X-parameters. Assuming that the interfering signals are relatively small compared to the nominal input signal, the output signal can be described as a superposition of the effects of each input signal. In order to determine the functional correlation between the scattering variables, a polynomial dependency is assumed. The required datasets for the approximation of the describing functions are simulated by a directional coupler model in Cadence Design Framework. The polynomial coefficients are obtained by a least-square method. The resulting describing functions can be used to predict the system's behavior under certain conditions as well as the effects of the interfering signal on the output signal. brbr sup1/sup X-parameter is a registered trademark of Agilent Technologies, Inc.
机译:在本文中,提出了一种对带有X参数 1 的非线性2端口网络进行失真分析的第一种方法。 Verspecht和Root(2006)引入的X参数为描述大信号条件下的非线性微波2端口网络提供了可能性。在使用非线性网络分析仪(NVNA)进行X参数测量的基础上,可以提取网络的行为模型。这些模型可用于考虑微波电路设计过程中的非线性行为。本工作的思想是提取行为模型,以描述干扰信号对非线性电路输出行为的影响。因此,使用模拟器代替NVNA提取X参数。假设干扰信号与标称输入信号相比相对较小,则输出信号可以描述为每个输入信号效果的叠加。为了确定散射变量之间的函数相关性,假设多项式相关性。 Cadence设计框架中的定向耦合器模型模拟了描述函数近似所需的数据集。通过最小二乘法获得多项式系数。所得的描述函数可用于预测某些条件下的系统行为以及干扰信号对输出信号的影响。 1 X参数是Agilent Technologies,Inc.的注册商标。

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