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Analysis of Linear Non-Destructive Testing and Evaluation Methods for Thin-Walled Structure Inspection Using Ultrasonic Array

机译:超声阵列薄壁结构检测的线性无损检测与评估方法分析

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The ultrasonic array used for thin-walled structure non-destructive inspection usually has a high central frequency so that the thickness-to-acoustic wavelength ratio is greater than 10. When the ratio is much smaller than 10, the reliability of the conventional ultrasonic array method will dramatically decrease due to the influence of the acoustic near-field. This situation is unavoidable since the available central frequency of the array transducer cannot be an arbitrarily large value. To optimize the inspection performance in this case, the testing of an ultrasonic array and the evaluation of a structure whose thickness is smaller than five-times the longitudinal wavelength are analyzed in this paper. Linear ultrasonic array methods using different combinations of wave patterns, reflection times, and coupling conditions are uniformly expressed as full matrix algorithms. Simulated and experimental full matrices of 6 mm-thick aluminum plates using a 5-MHz array transducer are captured to analyze their imaging performances and sizing abilities with respect to various defects. Analyses show that the inspection results of the wedge coupling method have a much higher signal-to-noise ratio (SNR) than the results of conventional direct contact methods. Circular defects and rectangular defects can be distinguished by comparing the imaging results of different modes. For the simulated circular defect, the diameter can be measured according to the maximum image amplitude of the defect. To simulate a rectangular defect located in the lower half of the region, the nominal length can be measured using a linear function whose input is a ?6 dB drop in length of the SS-S mode image. For a real sample, the material anisotropy and complex self-reflections will decrease the SNR by about 10 dB.
机译:用于薄壁结构无损检测的超声波阵列通常具有较高的中心频率,因此厚度与声波的波长比大于10。当该比值远小于10时,常规超声波阵列的可靠性由于声学近场的影响,该方法将大大减少。这种情况是不可避免的,因为阵列换能器的可用中心频率不能是任意大的值。为了优化这种情况下的检查性能,本文分析了超声阵列的测试和厚度小于纵向波长五倍的结构的评估。线性超声阵列方法使用波形,反射时间和耦合条件的不同组合统一表示为全矩阵算法。捕获使用5MHz阵列换能器的6mm厚铝板的模拟和实验全矩阵,以分析其针对各种缺陷的成像性能和尺寸确定能力。分析表明,楔形耦合法的检测结果比常规直接接触法的检测结果具有更高的信噪比(SNR)。通过比较不同模式的成像结果,可以区分出圆形缺陷和矩形缺陷。对于模拟的圆形缺陷,可以根据缺陷的最大图像幅度来测量直径。为了模拟位于该区域下半部分的矩形缺陷,可以使用线性函数来测量标称长度,该函数的输入为SS-S模式图像的长度下降了±6 dB。对于真实样品,材料各向异性和复杂的自反射将使SNR降低约10 dB。

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