GE Sensing & Inspection Technologies Introduces the v|tome|x L 300

摘要

GE Sensing & Inspection Technologies is adding the v tome x L 300 to its phoenix x-ray range. This is the first computed tomography (CT) system, which can achieve a resolution of I μm with a 300kV X-ray tube while offering even higher contrast resolution through a new temperature-stabilized GE digital detector. The new CT system is equally suited to 2D and 3D analysis as well as to the precise dimensional measurement of complex shaped components. As such, it will find particular application in the automotive and aerospace sectors, as well as the engineering sector in general.