...
首页> 外文期刊>Desalination and water treatment >Wetting patterns estimation in cultivation substrates under drip irrigation
【24h】

Wetting patterns estimation in cultivation substrates under drip irrigation

机译:滴灌条件下栽培基质的湿润模式估算

获取原文
获取原文并翻译 | 示例

摘要

To make an accurate and reasonable estimate of the wetting pattern in cultivation substrates, 36 experimental treatments with two replications were conducted under drip irrigation. An empirical model was suggested to predict the substrate full wetting pattern at different application times for T-1, T-2, T-3 and T-4. The maximum root mean square error and mean error were only 1.37 and 0.72 cm, and 1.22 and 0.71 cm for the wetted radius and depth of the full wetting pattern for T-1, T-2, T-3 and T-4. The proposed model performs well in predicting the full wetting pattern and can be used to operate and manage the irrigation system.
机译:为了准确,合理地估计栽培基质的润湿方式,在滴灌条件下进行了36次重复两次的实验处理。建议建立一个经验模型来预测T-1,T-2,T-3和T-4在不同应用时间的基质完全润湿模式。对于T-1,T-2,T-3和T-4,最大的均方根误差和均方根误差仅为1.37和0.72 cm,以及完全润湿模式的湿润半径和深度的1.22和0.71 cm。所提出的模型在预测整个湿润模式方面表现良好,可用于操作和管理灌溉系统。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号