首页> 外文期刊>Compel >Comparison between theoretical and measured shielded microstrip dispersion properties in a wide-frequency range
【24h】

Comparison between theoretical and measured shielded microstrip dispersion properties in a wide-frequency range

机译:在宽频率范围内理论和测量的屏蔽微带色散特性之间的比较

获取原文
获取原文并翻译 | 示例
           

摘要

Purpose - The purpose of this paper is to present the research on the effect of the shielding box to the dispersion properties of the microstrip lines, obtained by both theory analysis and the experimental test. Additionally, some principles about the effect of the shielding box are given, which could provide some useful information for the design of monolithic microwave integrated circuits. Design/methodology/approach - The dispersion of the shielded microstrip line is analysis by the MOL. The measured data are obtained by using vector network analyzer and the calibration method is through, reflect, line. The structure of the test fixtures will also be illustrated in this paper. Findings - The size of the shielding box has a great impact on the dispersion properties of the microstrip lines. The shielding box will lead to the decrease of the effective dielectric constant of the shielded microstrip lines. The effects of shielding box have a big relation to the ratio of the size of the shielding box to the size of the microstrip lines. When this ratio becomes bigger, the effects will decrease and can even be ignored completely.rnOriginality/value - This paper presents the effects of the shielding box on the dispersion properties of the microstrip lines. Both the measured results and the theory analysis are given in a wide-frequency range and the structures of the test fixture are also illustrated in detail.
机译:目的-本文的目的是通过理论分析和实验测试,介绍屏蔽盒对微带线色散特性影响的研究。此外,给出了有关屏蔽盒作用的一些原理,这些原理可以为单片微波集成电路的设计提供一些有用的信息。设计/方法/方法-屏蔽微带线的色散由MOL分析。使用矢量网络分析仪获得测量数据,校准方法是通过,反射,在线。本文还将说明测试夹具的结构。发现-屏蔽箱的尺寸对微带线的色散特性有很大影响。屏蔽盒将导致屏蔽微带线的有效介电常数降低。屏蔽盒的效果与屏蔽盒尺寸与微带线尺寸的比值有很大关系。当该比例增大时,其影响将减小,甚至可以完全忽略。rnriginity / value-本文介绍了屏蔽盒对微带线色散特性的影响。测量结果和理论分析都在很宽的频率范围内给出,并且还详细说明了测试夹具的结构。

著录项

  • 来源
    《Compel》 |2010年第2期|p.536-544|共9页
  • 作者

    Bo Gao; Ling Tong;

  • 作者单位

    College of Automation, University of Electronic Science and Technology of China, Chengdu, China;

    College of Automation, University of Electronic Science and Technology of China, Chengdu, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    calibration; frequencies; monolithic integrated circuits; microwaves;

    机译:校准;频率单片集成电路;微波炉;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号