首页> 外文期刊>Clays and clay minerals >RIETVELD REFINEMENT OF DISORDERED ILLITE-SMECTITE MIXED-LAYER STRUCTURES BY A RECURSIVE ALGORITHM. Ⅱ: POWDER-PATTERN REFINEMENT AND QUANTITATIVE PHASE ANALYSIS
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RIETVELD REFINEMENT OF DISORDERED ILLITE-SMECTITE MIXED-LAYER STRUCTURES BY A RECURSIVE ALGORITHM. Ⅱ: POWDER-PATTERN REFINEMENT AND QUANTITATIVE PHASE ANALYSIS

机译:用递归算法细化不规则伊利石-蒙脱石混合层结构的RIETVELD。 Ⅱ:粉体细化和定量相分析

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X-ray diffraction (XRD) of powdered materials is one of the most common methods used for structural characterization as well as for the quantification of mineral contents in mixtures. The application of the Rietveld method for that purpose requires structure models for each phase. The recursive calculation of structure factors was applied here to the Rietveld refinement of XRD powder patterns of illite-smectite (I-S) minerals. This approach allowed implementation of stacking disorder in structural models. Models for disordered stacking of cis-vacant and trans-vacant dioctahedral 2:1 layers as well as rotational disorder were combined with models for mixed layering of illitic and smectitic layers. The DIFFaX code was used to simulate non-basal (hk) reflections of illites with different degrees of disorder. Rietveld refinements of these simulated patterns were used to evaluate the application of this new approach. A model describing rotational disorder (n·120° and w·60° rotations) and mixed layering of cis-vacant and trans-vacant dioctahedral layers was tested. Different starting parameters led to identical results within the ranges of standard deviations and confirmed the stability of the automatic refinement procedure. The influence on the refinement result of an incorrect choice of fixed parameters was demonstrated. The hk model was combined with models describing the basal reflections of disordered I-S and tested on measured data. A glauconitic mineral (Urkut, Hungary), an ordered I-S (ISCz-1, a special clay in the Source Clays Repository of The Clay Minerals Society), and a dioctahedral I-S (F4, Fuezerradvany, Hungary) were used as test substances. Parameters describing the mixed layering of illitic and smectitic layers were compared with the results from refinements of oriented mounts and showed good agreement. A pattern of a physical mixture of an I-S mineral and a turbostratically disordered smectite was analyzed in order to test the new approach for application in quantitative phase analysis. The quantitative Rietveld phase analysis results were found to be satisfactory.
机译:粉末材料的X射线衍射(XRD)是用于结构表征以及定量混合物中矿物质含量的最常用方法之一。为此目的,Rietveld方法的应用需要每个阶段的结构模型。将结构因子的递归计算应用于伊利石-蒙脱石(I-S)矿物XRD粉末图案的Rietveld精修。这种方法允许在结构模型中实现堆叠混乱。将顺-空和反-空二八面体2:1层的无序堆放模型以及旋转障碍与不规则层和近晶层的混合分层模型组合。 DIFFaX代码用于模拟具有不同程度混乱的伊利石的非基础(hk)反射。这些模拟模式的Rietveld改进用于评估此新方法的应用。测试了描述旋转无序(n·120°和w·60°旋转)以及顺空和反空二八面体混合层的模型。在标准偏差范围内,不同的起始参数导致相同的结果,并确认了自动精炼程序的稳定性。证明了错误选择固定参数对优化结果的影响。 hk模型与描述无序I-S基础反射的模型相结合,并在测量数据上进行了测试。用青釉质矿物(匈牙利乌尔库特),有序I-S(ISCz-1,粘土矿物学会来源粘土储存库中的特殊粘土)和双八面体I-S(F4,匈牙利富埃拉德万尼)作为测试物质。描述硅藻土层和近晶岩层混合分层的参数与定向安装的精炼结果进行了比较,并显示出良好的一致性。为了测试在定量相分析中应用的新方法,分析了I-S矿物和涡轮层无序蒙脱石的物理混合物的模式。发现定量的Rietveld相分析结果令人满意。

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