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Thermal Stability of Silica-Zirconia Membranes

机译:二氧化硅-氧化锆膜的热稳定性

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摘要

The thermal stability, phase transformation, surface morphology, pore size distribution and permeation of the defect-free silica-zirconia membrane were investigated by using X-ray diffraction (XRD), atomic force microscopy (AFM), gas adsorption analyzer (BET), and gas permeation apparatus, respectively. Using silica as the stabilizing agent, the defect-free membrane was much more stable than pure zirconia. The crystal transformation of zirconia in the silica-stabilized membrane could be prohibited by the interaction between silica and zirconia. ZrO_2 crystals were kept tetragonal below 900℃, the size of which did not change with temperature between 700℃ and 900℃. It was further verified by the AFM observation, pore size analysis and permeation study. This thermal stability makes the silica-zirconia membrane a good choice as the intermediate layer for zeolite and Pd-based membranes.
机译:使用X射线衍射(XRD),原子力显微镜(AFM),气体吸附分析仪(BET)研究了无缺陷二氧化硅-氧化锆膜的热稳定性,相变,表面形态,孔径分布和渗透性,和气体渗透装置。使用二氧化硅作为稳定剂,无缺陷膜比纯氧化锆稳定得多。二氧化硅和氧化锆之间的相互作用可以阻止氧化锆在二氧化硅稳定膜中的晶体转变。 ZrO_2晶体在900℃以下呈四方晶形,其大小在700℃至900℃之间不发生变化。原子力显微镜观察,孔径分析和渗透研究进一步证实了这一点。这种热稳定性使二氧化硅-氧化锆膜成为沸石和Pd基膜的中间层是一个不错的选择。

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