Structure and morphology of biaxially oriented films of polyethylenes

摘要

Biaxially oriented films of commercial polyethylenes were investigated using X-ray diffraction in directions transverse and perpendicular to the film plane. The surface morphology of the inner and outer faces of these films were studied in two directions by (a) transmission election microscopy employing replication procedures, (b) by atomic force microscopy (tapping mode) down to nanometer resolution, (c) scanning electron microscopy of ion-etched metal coated surfaces, and (d) small-angle X-ray scattering measurements obtained from the bulk films.