BinMaster introduces multiple scanner system for very large silos

摘要

BinMaster~? Level Controls has introduced the MVL multiple scanner system that integrates multiple point measurement data from two 3DLevelScanners to cover a very wide surface area and provide better inventory accuracy for large vessels. Designed specifically for the challenges of very large bins, the BinMaster MVL system displays a visual representation of the material surface that shows high and low points in the bin such as cone up, cone down, sidewall buildup or bridging.