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首页> 外文期刊>The Astrophysical journal >ELECTRON TRANSPORT DURING THE 1999 AUGUST 20 FLARE INFERRED FROM MICROWAVE AND HARD X-RAY OBSERVATIONS
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ELECTRON TRANSPORT DURING THE 1999 AUGUST 20 FLARE INFERRED FROM MICROWAVE AND HARD X-RAY OBSERVATIONS

机译:从微波和硬X射线观测推断出的1999年8月20日爆发的电子传输

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摘要

We discuss injection and transport of high-energy electrons during a GOES X-ray class M9.8 flare observed in microwaves with the Owens Valley Solar Array (OVSA) and in hard X-rays (HXRs) with the hard X-ray telescope (HXT) on board Yohkoh. Observed at 1 s timescales or better in both wavelength regimes, the event shows (1) a large difference in scale between the microwave source and the HXR source; (2) an unusually hard HXR spectrum (maximum spectral index ~ -1.6), followed by rapid spectral softening; and (3) a microwave light curve containing both impulsive peaks (3 s rise time) simultaneous with those of the HXRs and a long, extended tail with a uniform decay rate (2.3 minutes). We analyze the observations within the framework of the electron trap-and-precipitation model, allowing a time-dependent injection energy spectrum. Assuming thick-target bremsstrahlung for the HXRs, we infer the electron injection function in the form Q(E, t) ~ (E/E_0)~(-δ(t)) where the timescale for δ(t) to change by unity is ~7 s. This injection function can account for the characteristics of the impulsive part of the microwave burst by considering the bulk of the electrons to be directly precipitating without trapping. The same injection function also accounts for the gradual part of the microwave emission by convolving the injection function with a kernel representing the trapping process, which at late times gives N(E, t) ~ e~(-vt) (E/E_0)~(-b). We require b ~ 1.4 and v ~ 6 x 10~(-3)聅~(-1), where β is the electron speed divided by the speed of light. Therefore, the derived form of the precipitation rate v itself indicates strong pitch-angle diffusion, but the slow decay of the microwave radiation requires a small loss cone (~4°) and a low ambient density in the coronal trap. Also, the numbers of electrons needed to account for the two components of the microwave emission differ by an order of magnitude. We estimate that the ≥100 keV number of the directly precipitating electrons is ~10~(33), while the trapped population requires ~10~(32) electrons. This leads us to a model of two interacting loops, the larger of which serves as an efficient trap while the smaller provides the impulsive source. These characteristics are consistent with the spatially resolved observations.
机译:我们讨论了使用Owens Valley太阳电池(OVSA)在微波中以及在使用硬X射线望远镜在硬X射线(HXR)中观察到的GOES X射线M9.8级耀斑中高能电子的注入和传输( HXT)登上Yohkoh。在两个波长范围内均以1 s或更佳的时间尺度观察到,该事件表明(1)微波源和HXR源之间的尺度差异很大; (2)异常硬的HXR光谱(最大光谱指数〜-1.6),然后迅速光谱软化; (3)微波曲线,其中包含与HXR同时出现的两个脉冲峰(上升时间为3 s)和一条长尾巴,并具有均匀的衰减速率(2.3分钟)。我们在电子陷阱和沉淀模型的框架内分析了观测结果,从而得出了随时间变化的注入能谱。假设HXR的厚目标致辐射,我们以Q(E,t)〜(E / E_0)〜(-δ(t))的形式推断电子注入函数,其中δ(t)的时间尺度统一变化是〜7 s。该注入功能可以通过考虑大量电子被直接沉淀而不被俘获来说明微波脉冲的脉冲部分的特性。通过将注入函数与代表捕获过程的内核进行卷积,相同的注入函数还可以解释微波发射的渐进部分,该核在后期给出N(E,t)〜e〜(-vt)(E / E_0) 〜(-b)。我们需要b〜1.4和v〜6 x 10〜(-3)聅〜(-1),其中β是电子速度除以光速。因此,降水率v的推导形式本身表明了强的俯仰角扩散,但微波辐射的缓慢衰减需要一个小的损耗锥(〜4°)和在冠状阱中的低环境密度。同样,解释微波发射的两个分量所需的电子数量相差一个数量级。我们估计直接析出的电子的≥100keV数为〜10〜(33),而被俘获的种群则需要〜10〜(32)个电子。这导致我们建立了两个相互作用的回路模型,其中较大的回路用作有效陷阱,而较小的回路提供脉冲源。这些特征与空间分辨的观测结果一致。

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