NI Innovates Solution to Meet Evolving Wireless Test Needs

摘要

During the recent NI Wireless Communication Measure and Design Symposium held in Taipei, Taiwan, National Instruments introduced the Wireless Test System (WTS), a solution targeted on lowering the cost of high-volume wireless manufacturing test and multiplying throughput on the production floor with a system optimized for measurement speed and parallel test. Katherine Hsieh, Associate Product Line Director of Broadcom Corporation, at her keynote speech said, "Increasing features, bandwidth, and new technologies such as MU-MIMO, 1024QAM make new challenges for wireless communication test time and test coverage. The integration of more technology testing on one station as well as the combo product test such as Bluetooth/Wi-Fi/ ZigBee/NFC/GPS, each of which has to be verified in manufacturing. The overwhelming IoTs, how to test devices embedded on 'things', also complicate the test."