机译:椭圆偏振光谱法研究拓扑保护的Bi_(1-x)Se_x薄膜在载流子浓度可见范围内的分散特性
Fudan Univ, Dept Opt Sci & Engn, Shanghai Engn Res Ctr Ultraprecis Opt Mfg, Shanghai 200433, Peoples R China;
China Acad Engn Phys, Mianyang 621900, Peoples R China;
Fudan Univ, Dept Opt Sci & Engn, Shanghai Engn Res Ctr Ultraprecis Opt Mfg, Shanghai 200433, Peoples R China;
Fudan Univ, Dept Opt Sci & Engn, Shanghai Engn Res Ctr Ultraprecis Opt Mfg, Shanghai 200433, Peoples R China;
Fudan Univ, Dept Opt Sci & Engn, Shanghai Engn Res Ctr Ultraprecis Opt Mfg, Shanghai 200433, Peoples R China;
Fudan Univ, Dept Opt Sci & Engn, Shanghai Engn Res Ctr Ultraprecis Opt Mfg, Shanghai 200433, Peoples R China;
Fudan Univ, Dept Opt Sci & Engn, Shanghai Engn Res Ctr Ultraprecis Opt Mfg, Shanghai 200433, Peoples R China;
Fudan Univ, Dept Opt Sci & Engn, Shanghai Engn Res Ctr Ultraprecis Opt Mfg, Shanghai 200433, Peoples R China;
Fudan Univ, Dept Opt Sci & Engn, Shanghai Engn Res Ctr Ultraprecis Opt Mfg, Shanghai 200433, Peoples R China;
Fudan Univ, Dept Opt Sci & Engn, Shanghai Engn Res Ctr Ultraprecis Opt Mfg, Shanghai 200433, Peoples R China;
Topological insulator; Bismuth selenide; Spectroscopic ellipsometry; Optical property;
机译:Hg_(1-x)Cd_xSe薄膜的介电函数和载流子浓度
机译:椭圆偏振光谱法研究Si(111)上纤锌矿InN外延膜的载流子浓度依赖性光学性质
机译:依赖于温度的光谱椭偏法揭示了多铁性Bi_(1-x)La_xFe_(1-y)Ti_yO_3陶瓷的带间电子跃迁和相变
机译:通过光谱椭圆形测量研究的Si(111)上的Wurzite Inn外延膜的载体浓度依赖性光学性质
机译:光谱反射法和椭圆偏振法测定固体薄膜的光学性能
机译:通过原位光谱椭圆偏振法在金属氧化物薄膜的等离子体增强原子层沉积过程中发现前体-表面相互作用
机译:载流子浓度不同的Si(111)上纤锌矿InN外延膜的椭圆偏振光谱研究
机译:用蒙特卡罗计算机模拟,载波隧穿和光谱椭偏仪研究3-5个半导体薄膜的分子束外延生长