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The microstructure and properties of tungsten alloying layer on copper by high-current pulse electron beam

机译:大电流脉冲电子束在铜上钨合金层的组织与性能

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摘要

In this paper, tungsten (W) was chosen to be an alloying element into the surface layer of commercial pure (cp) copper (Cu) to enhance the surface properties after surface alloying by high current pulsed electron beam (HCPEB). After HCPEB irradiation, part of the blended powder was dissolved into the substrate surface to form an alloyed layer, which has defect structures consisting of dislocation cellws/walls. The presence of defect structures induced by HCPEB irradiation provides a large amount of paths for W atoms to form solid solution and ultrafine W particles. The surface hardening is ascribed to intense plastic deformation via stress, sub-grain strengthening, along with the alloying elements via precipitation hardening and/or the solid solution strengthening. The corrosion performance, tested in 3.5% NaCl solution, was significantly enhanced after surface alloying. The improvement in corrosion resistance is essentially attributed to the combination of the structure defects and the addition of alloying elements to form more stable passive film. (C) 2017 Elsevier B.V. All rights reserved.
机译:在本文中,选择钨(W)作为商用纯(cp)铜(Cu)表面层的合金元素,以增强通过大电流脉冲电子束(HCPEB)表面合金化后的表面性能。在HCPEB辐照后,将部分混合粉末溶解到基底表面以形成合金层,该合金层的缺陷结构由位错小室/壁组成。 HCPEB辐照引起的缺陷结构的存在为W原子形成固溶体和超细W颗粒提供了大量途径。表面硬化归因于通过应力,亚晶粒强化的强烈塑性变形,以及通过沉淀硬化和/或固溶强化的合金元素。表面合金化后,在3.5%NaCl溶液中测试的腐蚀性能得到显着提高。耐蚀性的提高主要归因于结构缺陷和添加合金元素以形成更稳定的钝化膜的结合。 (C)2017 Elsevier B.V.保留所有权利。

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