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XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach

机译:衍生化的胺和酐等离子体聚合物的XPS深度剖析:衍生化方法局限性的证据

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摘要

The quantitative analysis of the chemistry at the surface of functional plasma polymers is highly important for the optimization of their deposition conditions and, therefore, for their subsequent applications. The chemical derivatization of amine and carboxyl-anhydride layers is a well-known technique already applied by many researchers, notwithstanding the known drawback of the derivatization procedures like side or uncomplete reactions that could lead to "unreliable" results. In this work, X-ray photoelectron spectroscopy (XPS) combined with depth profiling with argon clusters is applied for the first time to study derivatized amine and carboxyl-anhydride plasma polymer layers. It revealed an additional important parameter affecting the derivatization reliability, namely the permeation of the derivatizing molecule through the target analysed layer, i.e. the composite effect of the probe molecule size and the layer porosity. Amine-rich films prepared by RF low pressure plasma polymerization of cyclopropylamine were derivatized with trifluoromethyl benzaldehide (TFBA) and it was observed by that the XPS-determined NH2 concentration depth profile is rapidly decreasing over top ten nanometers of the layer. The anhydride-rich films prepared by atmospheric plasma co-polymerization of maleic anhydride and C2H2 have been reacted with, parafluoroaniline and trifluoroethyl amine. The decrease of the F signal in top surface layer of the anhydride films derivatized by the "large" parafluoroaniline was observed similarly as for the amine films but the derivatization with the smaller trifluoroethylamine (TFEA) led to a more homogenous depth profile. The data analysis suggests that the size of the derivatizing molecule is the main factor, showing that the very limited permeation of the TFBA molecule can lead to underestimated densities of primary amines if the XPS analysis is solely carried out at a low take-off angle. In contrast, TFEA is found to be an efficient derivatization agent of anhydride groups with high permeability through the carboxyl-anhydride layer. (C) 2016 Elsevier B.V. All rights reserved.
机译:功能性等离子聚合物表面化学反应的定量分析对于优化其沉积条件并因此对其后续应用非常重要。胺和羧基酐层的化学衍生化是许多研究人员已应用的众所周知的技术,尽管衍生化程序存在已知的缺点,例如可能导致“不可靠”结果的副反应或不完全反应。在这项工作中,首次应用X射线光电子能谱(XPS)与氩气簇的深度剖析相结合来研究衍生化的胺和羧基酸酐等离子体聚合物层。它揭示了影响衍生可靠性的另一个重要参数,即衍生分子通过目标分析层的渗透,即探针分子大小和层孔隙率的综合影响。通过三氟甲基苯甲醛(TFBA)衍生化了通过环丙胺的RF低压等离子体聚合制备的富胺膜,并观察到XPS测定的NH2浓度深度分布在层的前十纳米处迅速减小。通过马来酸酐和C 2 H 2的大气等离子体共聚制备的富含酸酐的膜已经与对氟苯胺和三氟乙胺反应。与胺膜相似,观察到由“大”对氟苯胺衍生的酸酐膜的上表面层中F信号的减少,但是用较小的三氟乙胺(TFEA)衍生导致深度分布更均匀。数据分析表明,衍生分子的大小是主要因素,表明如果仅在低起飞角进行XPS分析,则TFBA分子的渗透非常有限,会导致伯胺的密度被低估。相反,发现TFEA是具有高渗透性的酸酐基团的有效衍生剂,其通过羧基酸酐层。 (C)2016 Elsevier B.V.保留所有权利。

著录项

  • 来源
    《Applied Surface Science》 |2017年第1期|578-585|共8页
  • 作者单位

    Natl Univ Sci & Technol MISiS, Leninsky Pr 4, Moscow 119049, Russia|Masaryk Univ, CEITEC, RG Plasma Technol, Purkynova 123, Brno 61200, Czech Republic;

    Masaryk Univ, CEITEC, RG Plasma Technol, Purkynova 123, Brno 61200, Czech Republic|Masaryk Univ, Fac Sci, Dept Phys Elect, Kotlarska,2, CS-61137 Brno, Czech Republic;

    Univ Namur, Dept Phys, LISE, Rue Bruxelles,61, B-5000 Namur, Belgium;

    Univ Namur, Dept Phys, LISE, Rue Bruxelles,61, B-5000 Namur, Belgium;

    Masaryk Univ, CEITEC, RG Plasma Technol, Purkynova 123, Brno 61200, Czech Republic;

    Masaryk Univ, CEITEC, RG Plasma Technol, Purkynova 123, Brno 61200, Czech Republic|Masaryk Univ, Fac Sci, Dept Phys Elect, Kotlarska,2, CS-61137 Brno, Czech Republic;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    XPS depth profiling; Surface reactions; Amine derivatization; TFBA; Plasma polymers;

    机译:XPS深度分析;表面反应;胺衍生化;TFBA;等离子聚合物;

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