Antireflection Textured Coating for Silicon Solar Cells

摘要

A germanium antireflection coating was applied at an angle of 75°-80° to the normal of a silicon substrate surface. Regular structures obtained on the silicon surface were visible as dots in the field of view of an MII-4 microinterferometer. As a result of surface texturing, the integral reflection coefficient of silicon decreased by 64.0%, while the short-circuit current density increased by 29%.